23 - 25 October 2018
The Particle Stamp for SEM was designed for analysis by scanning electron microscope (SEM). The Particle Stamp for SEM suitable due to its material base structures to analyse particles with particle size > 25 µm. An analysis of purely metallic particle from a particle size starting of 5 µm possible. Particles remain fixed in position. Object holder can be tilted or rotated for different perspectives of the particle.
Training, Courses and Symposia and congresses as:
Basic training Technical Cleanliness
Specific training for production planning, product development, quality management, ...
customer-oriented, targeted consulting and support for:
Technical Cleanliness Assessment in Production
Audit / Potential Analysis
independent, accredited testing laboratory in accordance with DIN EN ISO 17025 for:
Cleanliness analyses as per VDA 19 or ISO 16232
Cleanliness analyses as per specific ...
Particle Rocker for large-area extraction of particle contamination on plane surfaces. By directly extracting the particles from the surface there is no need for ...
The particle stamp of CleanControlling GmbH is an advancement of the VDA 19 part 2, Technical cleanliness in assembly; Environment, Logistics, Personnel and Assembly ...
The particle trap of CleanControlling GmbH is an advancement of the VDA 19 part 2, Technical cleanliness in assembly; Environment, Logistics, Personnel and Assembly ...