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parts2clean, 5 - 7 October 2021

Analysis

Product description

Analysis of interfaces, microstructures, materials and tools

Preparation of complex samples and interfaces; all common methods of material, surface and microstructure analysis (SEM, TEM, FIB, EDX, SIMS, SNMS, XPS).

Hall 7, Stand A10

(Main stand)

Stored items

0

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