5 - 7 October 2021
Physical Electronics GmbH
Unique combination of surface analysis methods, XPS, TOF-SIMS and AES. If routine analysis is no longer helpful, then our service will be valuable for you. We operate our analysis systems on a daily basis and with the many years of experience of the instrument manufacturer. High availability is guaranteed by our in-house technical service and leads to very fast answers to our customers' problems. The spectra and measured data are the basis of the answers. Has conventional analysis failed in small analysis areas and thin layers? Additional sample preparation should be avoided? Our contract analytics laboratory for the identification of substances in the micro and nanometer range. Special analysis of the thinnest layers on the surface requires sophisticated analytical methods. The surface chemistry is determined by the top nanometers and our analytical methods look exactly there: The top 5- 10nm. Local distributions of substances can be intentional (structure), or unintentional (stains). This we can find out with our methods by an imaging analysis in the micrometer range. If it has to go deeper, sputter ablation also makes the micrometers below the surface accessible. Providing fast and understandable answers is the focus of our daily work.
Surface Analysis techniques help you to understand the composition of the outer most atomic layers of a material which plays a critical role in properties such as: ...