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parts2clean, 22 - 24 October 2019
Homepage>Exhibitors & Products >Particle Stamp for Sem

Particle Stamp for Sem

Logo CleanControlling

Exhibitor

CleanControlling

Exhibitor details
Exhibitor details
Logo Particle Stamp for Sem
Logo Particle Stamp for Sem
Logo Particle Stamp for Sem

Product description

The Particle Stamp for SEM was designed for analysis by scanning electron microscope (SEM).
The Particle Stamp for SEM suitable due to its material base structures to analyse particles with particle size > 25 µm. An analysis of purely metallic particle from a particle size starting of 5 µm possible. Particles remain fixed in position. Object holder can be tilted or rotated for different perspectives of the particle.

Product website

Hall 5, Stand B56

A focus on particles

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