22 - 24 October 2019
The particle stamp of CleanControlling GmbH is an advancement of the VDA 19 part 2, Technical cleanliness in assembly; Environment, Logistics, Personnel and Assembly Equipment, described a method of monitoring particles which enables them to be correlated to the actual surface charge possible. It is used for mounting of particle contaminants or for observing the presence of particles at defined locations.The use of particle stamp can be made in monitoring of particulate contamination of jobs and to components. By direct extraction of the particles from the surface reserved the costly and time-consuming liquid extraction.The acceptance of particle be made under defined, reproducible operations. By the flexible spring element, a uniform contact pressure and thus an uniform independent inspectors particle removal from the surface is ensured.
Novel, supplementary test method for the testing of surface cleanliness by means of suction extraction (air) by suction of dry and adhesive particles of large surfaces ...
Independent, accredited testing laboratory in accordance with DIN EN ISO 17025 for:
Cleanliness inspection as per VDA 19.1 or ISO 16232
Cleanliness inspection as ...
Training, Courses and Symposia and congresses as:
Basic training Technical Cleanliness
Specific training for production planning, product development, quality management, ...
customer-oriented, targeted consulting and support for:
Technical Cleanliness Assessment in Production
Audit / Potential Analysis
The particle trap of CleanControlling GmbH is an advancement of the VDA 19 part 2, Technical cleanliness in assembly; Environment, Logistics, Personnel and Assembly ...
The particle stamp of CleanControlling GmbH is an advancement of the VDA 19 part 2, Technical cleanliness in assembly; Environment, Logistics, Personnel and Assembly ...
Particle Rocker for large-area extraction of particle contamination on plane surfaces. By directly extracting the particles from the surface there is no need for ...
The Particle Stamp for SEM was designed for analysis by scanning electron microscope (SEM).
The Particle Stamp for SEM suitable due to its material base structures ...