22 - 24 October 2019
Novel, supplementary test method for the testing of surface cleanliness by means of suction extraction (air) by suction of dry and adhesive particles of large surfaces or of control areas on workpiece carriers or process environments. The particles are dissolved by the suction principle by means of a suction nozzle, brush nozzle or surface nozzle from the surface and sucked off. The particles can be separated by the cyclone unit or can be extracted directly to an analysis filter.The mobile complete system is suitable for cleanliness tests by suction extraction on site of large-area components, in the logistics environment, e.g. of packaging, storage and transport containers, of non-wet materials, e.g. Styrodur containers, in production processes, e.g. workpiece carriers or in the goods receipt inspection of large components.Low operating costs due to the elimination of liquid extraction media and their filtration, lower time, manipulation and logistical efforts due to the mobile and independent system are the main important features for this novel test method by suction extraction.
Independent, accredited testing laboratory in accordance with DIN EN ISO 17025 for:
Cleanliness inspection as per VDA 19.1 or ISO 16232
Cleanliness inspection as ...
Training, Courses and Symposia and congresses as:
Basic training Technical Cleanliness
Specific training for production planning, product development, quality management, ...
customer-oriented, targeted consulting and support for:
Technical Cleanliness Assessment in Production
Audit / Potential Analysis
The particle trap of CleanControlling GmbH is an advancement of the VDA 19 part 2, Technical cleanliness in assembly; Environment, Logistics, Personnel and Assembly ...
The particle stamp of CleanControlling GmbH is an advancement of the VDA 19 part 2, Technical cleanliness in assembly; Environment, Logistics, Personnel and Assembly ...
Particle Rocker for large-area extraction of particle contamination on plane surfaces. By directly extracting the particles from the surface there is no need for ...
The Particle Stamp for SEM was designed for analysis by scanning electron microscope (SEM).
The Particle Stamp for SEM suitable due to its material base structures ...